SALEM, M. R.; TALAT, L. A. Failure Dependence Of Semiconductor Devices On Low Temperatures. Al-Mukhtar Journal of Sciences, Al Bayda, Libya, v. 5, n. 1, p. 43–65, 1998. DOI: 10.54172/mjsc.v5i1.563. Disponível em: https://omu.edu.ly/journals/index.php/mjsc/article/view/563. Acesso em: 27 apr. 2024.